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Improving the measurement of dielectric function by TEM-EELS: avoiding the retardation effect
| Title: | Improving the measurement of dielectric function by TEM-EELS: avoiding the retardation effect |
| Authors: | Sakaguchi, Norihito Browse this author →KAKEN DB | | Tanda, Luka Browse this author | | Kunisada, Yuji Browse this author |
| Keywords: | Kramers-Kronig analysis | | dielectric function | | retardation effect | | alpha-Al2O3 |
| Issue Date: | Oct-2016 |
| Publisher: | Oxford University Press |
| Journal Title: | Microscopy |
| Volume: | 65 |
| Issue: | 5 |
| Start Page: | 415 |
| End Page: | 421 |
| Publisher DOI: | 10.1093/jmicro/dfw023 |
| PMID: | 27385785 |
| Abstract: | We investigated an improved Kramers-Kronig analysis (KKA) routine for measuring the dielectric function of alpha-Al2O3, avoiding the retardation effect arising in electron energy-loss spectroscopy (EELS). The EELS data differed from the optical data in the energy range of 10-20 eV due to the retardation effect, even though Cerenkov loss was thoroughly suppressed. The calculated differential cross-section indicates that the influence of the retardation appears at scattering angles less than 0.2 mrad in the loss energy range of 10-15 eV. Using the improved KKA routine, we obtained the correct dielectric function that agreed with the optical data. The present technique is especially useful in measuring the dielectric function by EELS with a small collection semi-angle. |
| Rights: | This is a pre-copyedited, author-produced version of an article accepted for publication in Microscopy following peer review. The version of record Microscopy (2016) 65(5): 415-421. is available online at: http://dx.doi.org/10.1093/jmicro/dfw023. |
| Type: | article (author version) |
| URI: | http://hdl.handle.net/2115/67214 |
| Appears in Collections: | エネルギー・マテリアル融合領域研究センター (Center for Advanced Research of Energy and Material) > 雑誌発表論文等 (Peer-reviewed Journal Articles, etc)
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Submitter: 坂口 紀史
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