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Improving the measurement of dielectric function by TEM-EELS: avoiding the retardation effect

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タイトル: Improving the measurement of dielectric function by TEM-EELS: avoiding the retardation effect
著者: Sakaguchi, Norihito 著作を一覧する
Tanda, Luka 著作を一覧する
Kunisada, Yuji 著作を一覧する
キーワード: Kramers-Kronig analysis
dielectric function
retardation effect
発行日: 2016年10月
出版者: Oxford University Press
誌名: Microscopy
巻: 65
号: 5
開始ページ: 415
終了ページ: 421
出版社 DOI: 10.1093/jmicro/dfw023
抄録: We investigated an improved Kramers-Kronig analysis (KKA) routine for measuring the dielectric function of alpha-Al2O3, avoiding the retardation effect arising in electron energy-loss spectroscopy (EELS). The EELS data differed from the optical data in the energy range of 10-20 eV due to the retardation effect, even though Cerenkov loss was thoroughly suppressed. The calculated differential cross-section indicates that the influence of the retardation appears at scattering angles less than 0.2 mrad in the loss energy range of 10-15 eV. Using the improved KKA routine, we obtained the correct dielectric function that agreed with the optical data. The present technique is especially useful in measuring the dielectric function by EELS with a small collection semi-angle.
Rights: This is a pre-copyedited, author-produced version of an article accepted for publication in Microscopy following peer review. The version of record Microscopy (2016) 65(5): 415-421. is available online at:
資料タイプ: article (author version)
出現コレクション:雑誌発表論文等 (Peer-reviewed Journal Articles, etc)

提供者: 坂口 紀史


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