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Improving the measurement of dielectric function by TEM-EELS: avoiding the retardation effect

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Title: Improving the measurement of dielectric function by TEM-EELS: avoiding the retardation effect
Authors: Sakaguchi, Norihito Browse this author →KAKEN DB
Tanda, Luka Browse this author
Kunisada, Yuji Browse this author
Keywords: Kramers-Kronig analysis
dielectric function
retardation effect
Issue Date: Oct-2016
Publisher: Oxford University Press
Journal Title: Microscopy
Volume: 65
Issue: 5
Start Page: 415
End Page: 421
Publisher DOI: 10.1093/jmicro/dfw023
PMID: 27385785
Abstract: We investigated an improved Kramers-Kronig analysis (KKA) routine for measuring the dielectric function of alpha-Al2O3, avoiding the retardation effect arising in electron energy-loss spectroscopy (EELS). The EELS data differed from the optical data in the energy range of 10-20 eV due to the retardation effect, even though Cerenkov loss was thoroughly suppressed. The calculated differential cross-section indicates that the influence of the retardation appears at scattering angles less than 0.2 mrad in the loss energy range of 10-15 eV. Using the improved KKA routine, we obtained the correct dielectric function that agreed with the optical data. The present technique is especially useful in measuring the dielectric function by EELS with a small collection semi-angle.
Rights: This is a pre-copyedited, author-produced version of an article accepted for publication in Microscopy following peer review. The version of record Microscopy (2016) 65(5): 415-421. is available online at:
Type: article (author version)
Appears in Collections:エネルギー・マテリアル融合領域研究センター (Center for Advanced Research of Energy and Material) > 雑誌発表論文等 (Peer-reviewed Journal Articles, etc)

Submitter: 坂口 紀史

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