|
Hokkaido University Collection of Scholarly and Academic Papers >
Graduate School of Information Science and Technology / Faculty of Information Science and Technology >
Peer-reviewed Journal Articles, etc >
Turn-to-Turn Contact Resistance Measurement of No-Insulation REBCO Pancake Coils
| Title: | Turn-to-Turn Contact Resistance Measurement of No-Insulation REBCO Pancake Coils |
| Authors: | Noguchi, So Browse this author →KAKEN DB | | Miyao, Ryousuke Browse this author | | Okusa, Haruyoshi Browse this author | | Tatsuta, Takahiro Browse this author | | Ueda, Hiroshi Browse this author | | Kim, SeokBeom Browse this author →KAKEN DB |
| Keywords: | No-insulation winding technique | | REBCO pancake coil | | turn-to-turn contact resistance measurement |
| Issue Date: | Aug-2019 |
| Publisher: | IEEE (Institute of Electrical and Electronics Engineers) |
| Journal Title: | IEEE transactions on applied superconductivity |
| Volume: | 29 |
| Issue: | 5 |
| Start Page: | 4601605 |
| Publisher DOI: | 10.1109/TASC.2019.2903643 |
| Abstract: | The turn-to-turn contact resistance (characteristic resistance) is a very important factor to a no-insulation (NI)(RE)Ba-2 Cu3Oy (REBCO) pancake coil. It characterizes the stability and charging delay of NI REBCO pancake coils. However, the ordinary sudden-discharging method cannot measure the turnto-turn contact resistance under different conditions, such as an operating current, a temperature, and an external magnetic field. Although the turn-to-turn contact condition is strongly affected by the pressure inside of the NI REBCO coils, the feature of the contact resistance must he clarified to estimate the stability of NI REBCO coils. In this paper, we have proposed a new method to measure the turn-to-turn contact resistance applying ac current. The theory and the measurement results are also shown. The measured turn-to-turn contact resistance is reasonable, compared with that measured by the ordinary sudden-discharging method. In near future, we will measure the turn-to-turn contact resistance under different conditions by means of the proposed method. |
| Rights: | © 2019 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. |
| Type: | article (author version) |
| URI: | http://hdl.handle.net/2115/74264 |
| Appears in Collections: | 情報科学院・情報科学研究院 (Graduate School of Information Science and Technology / Faculty of Information Science and Technology) > 雑誌発表論文等 (Peer-reviewed Journal Articles, etc)
|
Submitter: 野口 聡
|
