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J. Jpn. Inst. Met. 60(4) 406.pdf684.56 kBPDFView/Open
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Title: 同位体比分離法によるTi-希薄Mo合金中のMoのSIMS定量分析
Other Titles: Quantitative SIMS Analysis of Mo in Ti-Dilute Mo Alloys Using Isotopic Abundance
Authors: 須藤, 雄一郎1 Browse this author
竹下, 博之2 Browse this author
鈴木, 亮輔3 Browse this author →KAKEN DB
冨井, 洋一4 Browse this author
小野, 勝敏5 Browse this author
Authors(alt): Sudo, Yuichiro1
Takeshita, Hiroyuki T.2
Suzuki, Ryosuke O.3
Tomii, Yoichi4
Ono, Katsutoshi5
Keywords: secondary ion mass spectrometry
titanium binary alloy
quantitative analysis
isotopic abundance
Issue Date: 1-Apr-1996
Publisher: 日本金属学会
Journal Title: 日本金属学会誌
Journal Title(alt): Journal of the Japan Institute of Metals
Volume: 60
Issue: 4
Start Page: 406
End Page: 411
Publisher DOI: 10.2320/jinstmet1952.60.4_406
Abstract: For the application of SIMS (Secondary Ion Mass Spectrometry) to quantitative analysis for the dilute element in metallic alloys, it is indispensable to eliminate the disturbance which is counted with the secondary ions of the dilute element. Ti2+ ions from the Ti matrix overlap the Mo+ ions from the Ti-dilute Mo alloys However, a conventional SIMS could not be applied to separate Ti2+ ions either by its high resolution mass analysis or by the separation based on the energy profiles. Since the secondary ion intensities of Mo+ and Ti2+ are proportional to their isotopic abundances, the secondary ion intensity of Mo+ can be calculated and separated from the measured intensity. Using the ion intensity of 92Mo+ or 100Mo+ after the disturbance elimination and the normalization, a good linear relationship for the quantitative Mo analysis was obtained in the range of 766 mass ppm to 2.31 mass%Mo. The lower quantitative limit is evaluated to be 80 mass ppm due to the improved preciseness.
Type: article
Appears in Collections:工学院・工学研究院 (Graduate School of Engineering / Faculty of Engineering) > 雑誌発表論文等 (Peer-reviewed Journal Articles, etc)

Submitter: 鈴木 亮輔

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