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電子線トモグラフィーによる格子欠陥の三次元観察

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J. Crys. Soc. Jpn 57 276.pdf2.59 MBPDFView/Open
Please use this identifier to cite or link to this item:http://hdl.handle.net/2115/75425

Title: 電子線トモグラフィーによる格子欠陥の三次元観察
Other Titles: Three-Dimensional Observation of Lattice Defects Using Electron Tomography
Authors: 波多, 聰1 Browse this author
光原, 昌寿2 Browse this author
中島, 英治3 Browse this author
池田, 賢一4 Browse this author →KAKEN DB
佐藤, 和久5 Browse this author
村山, 光宏6 Browse this author
工藤, 博幸7 Browse this author
宮崎, 伸介8 Browse this author
古河, 弘光9 Browse this author
Authors(alt): Hata, Satoshi1
Mitsuhara, Masatoshi2
Nakashima, Hideharu3
Ikeda, Ken-ichi4
Sato, Kazuhisa5
Murayama, Mitsuhiro6
Kudo, Hiroyuki7
Miyazaki, Shinsuke8
Furukawa, Hiromitsu9
Keywords: 三次元化
Issue Date: 31-Oct-2015
Publisher: 日本結晶学会
Journal Title: 日本結晶学会誌
Volume: 57
Issue: 5
Start Page: 276
End Page: 284
Publisher DOI: 10.5940/jcrsj.57.276
Abstract: Three-dimensionalization, i.e., direct representation or fabrication of three-dimensional (3D) objects, is now a key technology in various science and engineering fields. Electron microscopy, a vital nanoscale characterization tool, is no exception, thus various imaging methods have been developed to extend its imaging capabilities from conventional two dimensions to three dimensions. In this article, we focus on electron tomography (ET), which is a typical 3D imaging method using transmission electron microscopy (TEM) or scanning transmission electron microscopy(STEM), and overview the current status and future prospects of ET and an application of ET to 3D imaging of dislocations in crystalline materials as an practical example.
Type: article
URI: http://hdl.handle.net/2115/75425
Appears in Collections:工学院・工学研究院 (Graduate School of Engineering / Faculty of Engineering) > 雑誌発表論文等 (Peer-reviewed Journal Articles, etc)

Submitter: 池田 賢一

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