|
|
Hokkaido University Collection of Scholarly and Academic Papers >
Graduate School of Engineering / Faculty of Engineering >
Peer-reviewed Journal Articles, etc >
電子線トモグラフィーによる格子欠陥の三次元観察
| Title: | 電子線トモグラフィーによる格子欠陥の三次元観察 |
| Other Titles: | Three-Dimensional Observation of Lattice Defects Using Electron Tomography |
| Authors: | 波多, 聰1 Browse this author | | 光原, 昌寿2 Browse this author | | 中島, 英治3 Browse this author | | 池田, 賢一4 Browse this author →KAKEN DB | | 佐藤, 和久5 Browse this author | | 村山, 光宏6 Browse this author | | 工藤, 博幸7 Browse this author | | 宮崎, 伸介8 Browse this author | | 古河, 弘光9 Browse this author |
| Authors(alt): | Hata, Satoshi1 | | Mitsuhara, Masatoshi2 | | Nakashima, Hideharu3 | | Ikeda, Ken-ichi4 | | Sato, Kazuhisa5 | | Murayama, Mitsuhiro6 | | Kudo, Hiroyuki7 | | Miyazaki, Shinsuke8 | | Furukawa, Hiromitsu9 |
| Keywords: | 三次元化 |
| Issue Date: | 31-Oct-2015 |
| Publisher: | 日本結晶学会 |
| Journal Title: | 日本結晶学会誌 |
| Volume: | 57 |
| Issue: | 5 |
| Start Page: | 276 |
| End Page: | 284 |
| Publisher DOI: | 10.5940/jcrsj.57.276 |
| Abstract: | Three-dimensionalization, i.e., direct representation or fabrication of three-dimensional (3D) objects, is now a key technology in various science and engineering fields. Electron microscopy, a vital nanoscale characterization tool, is no exception, thus various imaging methods have been developed to extend its imaging capabilities from conventional two dimensions to three dimensions. In this article, we focus on electron tomography (ET), which is a typical 3D imaging method using transmission electron microscopy (TEM) or scanning transmission electron microscopy（STEM）, and overview the current status and future prospects of ET and an application of ET to 3D imaging of dislocations in crystalline materials as an practical example. |
| Type: | article |
| URI: | http://hdl.handle.net/2115/75425 |
| Appears in Collections: | 工学院・工学研究院 (Graduate School of Engineering / Faculty of Engineering) > 雑誌発表論文等 (Peer-reviewed Journal Articles, etc)
|
Submitter: 池田 賢一
|
