Hokkaido University Collection of Scholarly and Academic Papers >
Graduate School of Information Science and Technology / Faculty of Information Science and Technology >
Peer-reviewed Journal Articles, etc >
A simple screening current-induced magnetic field estimation method for REBCO pancake coils
Title: | A simple screening current-induced magnetic field estimation method for REBCO pancake coils |
Authors: | Noguchi, So Browse this author →KAKEN DB | Ueda, Hiroshi Browse this author | Hahn, Seungyong Browse this author | Ishiyama, Atsushi Browse this author | Iwasa, Yukikazu Browse this author |
Keywords: | HTS magnet | screening current | REBCO magnet |
Issue Date: | Apr-2019 |
Publisher: | IOP Publishing |
Journal Title: | Superconductor science and technology |
Volume: | 32 |
Issue: | 4 |
Start Page: | 045007 |
Publisher DOI: | 10.1088/1361-6668/aafe26 |
Abstract: | The development of NMR/MRI REBa2Cu3Oy (REBCO, RE = rare earth) magnets is happening all over the world. It has been found that screening current-induced magnetic fields (SCMFs) are a serious problem for NMR/MRI magnets wound with REBCO tapes. The reduction of SCMFs is strongly desired, and the estimation of SCMFs is also desired at the design stage of REBCO magnets. In order to evaluate a SCMF, a finite element method (FEM) or a boundary integration method is needed thus far, and a high-level simulation technique is required. In this paper, we develop an easy method to estimate a SCMF without a high-level simulation technique. In this method, the inductance of a winding turn is calculated and then a screening current is estimated according to the magnetic field penetrating into the winding turn. The SCMF is obtained from the estimated screening current. The SCMFs computed by the proposed method were compared with measurements and simulation results of the FEM. The results agreed well, but we can see a large difference. However, the SCMFs found by the proposed method are accurate enough to know they are at the design stage without the use of a high-level simulation technique. |
Rights: | This is a peer-reviewed, un-copyedited version of an article accepted for publication/published in Superconductor science and technology, Volume 34, Number 4. IOP Publishing Ltd is not responsible for any errors or omissions in this version of the manuscript or any version derived from it. The Version of Record is available online at http://doi.org/10.1088/1361-6668/aafe26. |
Type: | article (author version) |
URI: | http://hdl.handle.net/2115/77211 |
Appears in Collections: | 情報科学院・情報科学研究院 (Graduate School of Information Science and Technology / Faculty of Information Science and Technology) > 雑誌発表論文等 (Peer-reviewed Journal Articles, etc)
|
Submitter: 野口 聡
|