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Turn-to-Turn Contact Resistance Measurement of No-Insulation REBCO Pancake Coil at DC Current Operation

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Please use this identifier to cite or link to this item:http://hdl.handle.net/2115/78149

Title: Turn-to-Turn Contact Resistance Measurement of No-Insulation REBCO Pancake Coil at DC Current Operation
Authors: Noguchi, So Browse this author →KAKEN DB
Tatsuta, Takahiro Browse this author
Nishikawa, Daisuke Browse this author
Ueda, Hiroshi Browse this author
Kim, SeokBeom Browse this author →KAKEN DB
Keywords: No-insulation winding technique
REBCO pancake coil
turn-to-turn contact resistance measurement
Issue Date: Jun-2020
Publisher: IEEE (Institute of Electrical and Electronics Engineers)
Journal Title: IEEE transactions on applied superconductivity
Volume: 30
Issue: 4
Start Page: 9000305
Publisher DOI: 10.1109/TASC.2020.2970381
Abstract: No-insulation (NI) (RE)Ba tex-math notation="LaTeX">$_3$ (REBCO) magnets are very promising for practical applications to generate high magnetic field. The NI winding technique provides high thermal stability so that quench protection is unnecessary. However, the turn-to-turn contact resistance (sometimes called characteristic resistance) is an important factor to characterize the thermal stability and charging delay of NI REBCO pancake magnets. Although the conventional sudden-discharging method is widely used to measure the turn-to-turn contact resistance, it is not applicable to various conditions; e.g., the change of DC operating current and temperature. Therefore, we have previously proposed a turn-to-turn contact resistance measurement method using a low-frequency AC (LFAC) current. In this paper, we measured the contact resistance for different DC operating currents or change of DC current to confirm the validity of LFAC method. In addition, by heating a test coil, the contact resistances were also measured during the change of DC operating current. Since the electromagnetic stress is small enough not to change the contact condition, the change in contact resistance is negligible. The measured contact resistance was unchanged, so we could conclude that the LFAC method is effective in measurement of the contact resistance when DC operating current was applied.
Rights: © 2020 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
Type: article (author version)
URI: http://hdl.handle.net/2115/78149
Appears in Collections:情報科学院・情報科学研究院 (Graduate School of Information Science and Technology / Faculty of Information Science and Technology) > 雑誌発表論文等 (Peer-reviewed Journal Articles, etc)

Submitter: 野口 聡

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