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Turn-to-Turn Contact Resistance Measurement of No-Insulation REBCO Pancake Coil: External Field Dependence

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Title: Turn-to-Turn Contact Resistance Measurement of No-Insulation REBCO Pancake Coil: External Field Dependence
Authors: Noguchi, So Browse this author →KAKEN DB
Mori, Shunpei Browse this author
Mato, Takanobu Browse this author
Tatsuta, Takahiro Browse this author
Nishikawa, Daisuke Browse this author
Miyamoto, Kohei Browse this author
Inoue, Ryota Browse this author →KAKEN DB
Ueda, Hiroshi Browse this author →KAKEN DB
Kim, SeokBeom Browse this author →KAKEN DB
Keywords: No-insulation winding technique
REBCO pancake coil
turn-to-turn contact resistance measurement
Issue Date: Aug-2021
Publisher: IEEE (Institute of Electrical and Electronics Engineers)
Journal Title: IEEE transactions on applied superconductivity
Volume: 31
Issue: 5
Start Page: 4602105
Publisher DOI: 10.1109/TASC.2021.3070232
Abstract: The characteristics of no-insulation high-temperature superconducting (HTS) manet is dominated by the magnitude of the turn-to-turn contact resistance. A few techniques have been proposed to increase the turn-to-turn contact resistance. The relation between the turn-to-turn contact resistance and the magnet stability has also been investigated in simulations. Although the turn-to-turn contact resistance measurement was only the sudden-discharging method before, we proposed a low-frequency-AC current (LFAC) method. Using our proposed method, it is possible to measure the turn-to-turn contact resistance under various conditions. In a previous paper, we measured it when charging DC current to a single pancake coil. In this paper, the turn-to-turn contact resistance was measured by the LFAC method when an external field of 1-3 T was applied to a single pancake coil. The coil strain was also measured, and the relation of the turn-to-turn contact resistance and the coil strain was also discussed.
Rights: © 2021 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.
Type: article (author version)
URI: http://hdl.handle.net/2115/82850
Appears in Collections:情報科学院・情報科学研究院 (Graduate School of Information Science and Technology / Faculty of Information Science and Technology) > 雑誌発表論文等 (Peer-reviewed Journal Articles, etc)

Submitter: 野口 聡

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