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Plastic Deformation Simulation of REBCO Tapes Using Particle Methods
| Title: | Plastic Deformation Simulation of REBCO Tapes Using Particle Methods |
| Authors: | Mato, Takanobu Browse this author | | Noguchi, So Browse this author →KAKEN DB |
| Keywords: | Strain | | Plastics | | Integrated circuit modeling | | Deformable models | | Stress | | Mathematical models | | Magnetic forces | | Mechanical simulation | | particle method | | plastic deformation | | REBCO tape | | screening current |
| Issue Date: | Sep-2022 |
| Publisher: | IEEE (Institute of Electrical and Electronics Engineers) |
| Journal Title: | IEEE transactions on applied superconductivity |
| Volume: | 32 |
| Issue: | 6 |
| Start Page: | 8400705 |
| Publisher DOI: | 10.1109/TASC.2022.3185568 |
| Abstract: | Ultra-high field superconducting magnets are facing a mechanical degradation problem. On 2017, a world-record high DC magnetic field of 45.5 T was generated by insert no-insulation (NI) Rare-Earth Barium Copper Oxide (REBCO) pancake coils (14.4 T), called LBC3, and an outsert resistive magnet (31.1 T). Although the experiment showed a high potential of the NI REBCO magnets for ultra-high field generation, the insert NI REBCO pancake coils and the REBCO tapes were plastically deformed. The critical current properties of damaged REBCO tapes were degraded although the Hastelloy substrate of REBCO tapes is stiff and it has a high yield point of approximately 1 GPa. However, the mechanisms of the damaging REBCO tapes are not clarified. Therefore, it is necessary to clarify the mechanical phenomenon of REBCO tapes. In this paper, we model a REBCO tape with a smoothed particle hydrodynamics (SPH) method, which can represent plastic deformation. The SPH simulation is coupled with electromagnetic analysis with a partial element equivalent circuit (PEEC) model which we have previously developed. In the simulation, an external field, which linearly increases to 5 T and then decreases to 0 T, is applied to a short-length REBCO tape. The simulation results show that the REBCO tape largely deforms during the external field excitation and deexcitation. |
| Rights: | © 2022 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. |
| Type: | article (author version) |
| URI: | http://hdl.handle.net/2115/86749 |
| Appears in Collections: | 情報科学院・情報科学研究院 (Graduate School of Information Science and Technology / Faculty of Information Science and Technology) > 雑誌発表論文等 (Peer-reviewed Journal Articles, etc)
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Submitter: 野口 聡
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