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Inductive Voltage of Insert HTS Coils Due to Coil Deformation for Ultra-High Magnetic Field Generation
| Title: | Inductive Voltage of Insert HTS Coils Due to Coil Deformation for Ultra-High Magnetic Field Generation |
| Authors: | Noguchi, So Browse this author →KAKEN DB | | Mato, Takanobu Browse this author | | Hahn, Seungyong Browse this author |
| Keywords: | Coil deformation | | equivalent circuit model | | HTS magnet | | numerical simulation | | screening current |
| Issue Date: | Aug-2023 |
| Publisher: | IEEE (Institute of Electrical and Electronics Engineers) |
| Journal Title: | IEEE transactions on applied superconductivity |
| Volume: | 33 |
| Issue: | 5 |
| Start Page: | 4300905 |
| Publisher DOI: | 10.1109/TASC.2023.3271948 |
| Abstract: | Some rare earth-barium-copper-oxide (REBCO) magnets have been developed as an "insert" to generate ultra-high magnetic fields in a bore of "outsert" background magnets, mainly owing to their good in-field capabilities to generate high fields. Meanwhile, REBCO ultra-high field magnets are known to have some technical challenges such as screening current-induced stress and the consequent plastic deformation that recently attracts much attention from magnet engineers. The coil geometry deformation not only causes mechanical damage to the REBCO layer but affects the screening current distribution itself. Significant coil deformation may lead to deformation of coil current, which results in additional inductive voltage change of individual coils having differential coil inductance. In this article, we have investigated such extra inductive voltage due to coil configuration deformation using electromagnetic numerical simulation together with deformation finite element analysis. The simulation shows that an insert REBCO magnet for ultra-high magnetic field generation may have a small voltage rise induced by the coil inductance change. It also shows the screening current distribution change due to the coil deformation. |
| Rights: | © 2023 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. |
| Type: | article (author version) |
| URI: | http://hdl.handle.net/2115/90207 |
| Appears in Collections: | 情報科学院・情報科学研究院 (Graduate School of Information Science and Technology / Faculty of Information Science and Technology) > 雑誌発表論文等 (Peer-reviewed Journal Articles, etc)
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Submitter: 野口 聡
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