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Efficient vibrational excitation of molecular nitrogen in low-pressure plasma with ultralow electron temperature

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Title: Efficient vibrational excitation of molecular nitrogen in low-pressure plasma with ultralow electron temperature
Authors: Yamazaki, Masahiro Browse this author
Sasaki, Koichi Browse this author →KAKEN DB
Keywords: vibrational temperature
molecular nitrogen
recombining plasma
Issue Date: 13-Sep-2022
Publisher: IOP Publishing
Journal Title: Plasma Sources Science and Technology
Volume: 31
Issue: 9
Start Page: 94004
Publisher DOI: 10.1088/1361-6595/ac8b2f
Abstract: We investigated the vibrational temperature of molecular nitrogen in the downstream of helicon-wave excited helium and argon-based plasmas. It was confirmed by optical emission spectroscopy that the major part of the helium plasma was at a recombining state and it had an ultralow electron temperature of approximately 0.1 eV. In spite of the ultralow electron temperature, the vibrational temperature of molecular nitrogen, which was added into the helium plasma, was higher than that in the argon-based plasma at an ionizing state with an electron temperature of 1.7 eV. According to the relationship between the rate coefficient of electron impact vibrational excitation and the electron temperature, the higher vibrational temperature in the helium plasma is not attributable to the more efficient vibrational excitation. Therefore, the higher vibrational temperature is owing to the less efficient destruction of vibrational excited states in the helium plasma with the ultralow electron temperature.
Rights: This is the Accepted Manuscript version of an article accepted for publication in Plasma Sources Science and Technology. IOP Publishing Ltd is not responsible for any errors or omissions in this version of the manuscript or any version derived from it. The Version of Record is available online at https://iopscience.iop.org/article/10.1088/1361-6595/ac8b2f.
https://creativecommons.org/licenses/by-nc-nd/4.0/
Type: article (author version)
URI: http://hdl.handle.net/2115/90372
Appears in Collections:工学院・工学研究院 (Graduate School of Engineering / Faculty of Engineering) > 雑誌発表論文等 (Peer-reviewed Journal Articles, etc)

Submitter: 佐々木 浩一

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