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TypeAuthor(s)TitleOther TitlesCitationCitation(alt)Issue Date
articleIshioka, J.; Fujii, T.; Katono, K.; Ichimura, K.; Kurosawa, T.; Oda, M.; Tanda, S.Charge-parity symmetry observed through Friedel oscillations in chiral charge-density waves-Physical Review B-15-Dec-2011
article (author version)Tanvir, M. Tauseef; Fujii, T.; Aoki, Y.; Fushimi, K.; Habazaki, H.Dielectric properties of anodic films on sputter-deposited Ti–Si porous columnar films-Applied Surface Science-15-Jul-2011
articleKondo, H.; Kaji, H.; Fujii, T.; Hamada, K.; Arita, M.; Takahashi, Y.The influence of annealing temperature on ReRAM characteristics of metal/NiO/metal structure-IOP Conference Series: Materials Science and Engineering-2010
article (author version)Arita, M.; Kaji, H.; Fujii, T.; Takahashi, Y.Resistance switching properties of molybdenum oxide films-Thin Solid Films-1-May-2012
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