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TypeAuthor(s)TitleOther TitlesCitationCitation(alt)Issue Date
article (author version)Ooyama, Kimihito; Kato, Hiroki; Miczek, Marcin; Hashizume, TamotsuTemperature-Dependent Interface-State Response in an Al2O3/n-GaN Structure-Japanese Journal of Applied Physics-25-Jul-2008
articleMiczek, Marcin; Mizue, Chihoko; Hashizume, Tamotsu; Adamowicz, BogusławaEffects of interface states and temperature on the C-V behavior of metal/insulator/AlGaN/GaN heterostructure capacitors-Journal of Applied Physics-28-May-2008
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