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Nanoscale mechanical contacts probed with ultrashort acoustic and thermal waves

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Title: Nanoscale mechanical contacts probed with ultrashort acoustic and thermal waves
Authors: Dehoux, Thomas Browse this author
Wright, Oliver B. Browse this author
Voti, Roberto Li Browse this author
Gusev, Vitalyi E. Browse this author
Issue Date: 15-Dec-2009
Publisher: American Physical Society
Journal Title: Physical Review B
Volume: 80
Issue: 23
Start Page: 235409
Publisher DOI: 10.1103/PhysRevB.80.235409
Abstract: Using an ultrafast optical technique we measure coherent phonon-pulse reflection from - and heat flow across - a mechanical contact of nanoscale thickness between a thin metal film and a spherical dielectric indenter. Picosecond phonon wave packets at ∼50 GHz returning from this interface probe the pressure distribution, the contact area, and the indentation profile to subnanometer resolution, revealing the film deformation in situ. These measurements and simultaneous thermal-wave imaging at ≳1 MHz are consistent with significant enhancement of phonon transport across the near-contact nanogap.
Rights: ©2009 The American Physical Society
Type: article
Appears in Collections:工学院・工学研究院 (Graduate School of Engineering / Faculty of Engineering) > 雑誌発表論文等 (Peer-reviewed Journal Articles, etc)

Submitter: WRIGHT O. B.

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