Nanoscale mechanical contacts probed with ultrashort acoustic and thermal waves


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Please use this identifier to cite or link to this item:http://hdl.handle.net/2115/42549

Title:	Nanoscale mechanical contacts probed with ultrashort acoustic and thermal waves
Authors:	Dehoux, Thomas Browse this author
	Wright, Oliver B. Browse this author
	Voti, Roberto Li Browse this author
	Gusev, Vitalyi E. Browse this author
Issue Date:	15-Dec-2009
Publisher:	American Physical Society
Journal Title:	Physical Review B
Volume:	80
Issue:	23
Start Page:	235409
Publisher DOI:	10.1103/PhysRevB.80.235409
Abstract:	Using an ultrafast optical technique we measure coherent phonon-pulse reflection from - and heat flow across - a mechanical contact of nanoscale thickness between a thin metal film and a spherical dielectric indenter. Picosecond phonon wave packets at ∼50 GHz returning from this interface probe the pressure distribution, the contact area, and the indentation profile to subnanometer resolution, revealing the film deformation in situ. These measurements and simultaneous thermal-wave imaging at ≳1 MHz are consistent with significant enhancement of phonon transport across the near-contact nanogap.
Rights:	©2009 The American Physical Society
Type:	article
URI:	http://hdl.handle.net/2115/42549
Appears in Collections:	工学院・工学研究院 (Graduate School of Engineering / Faculty of Engineering) > 雑誌発表論文等 (Peer-reviewed Journal Articles, etc)

Submitter: WRIGHT O. B.

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