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A1-μW 600-ppm/℃ Current Reference Circuit Consisting of Subthreshold CMOS Circuits

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Please use this identifier to cite or link to this item:http://hdl.handle.net/2115/44205

Title: A1-μW 600-ppm/℃ Current Reference Circuit Consisting of Subthreshold CMOS Circuits
Authors: Ueno, Ken Browse this author
Hirose, Tetsuya Browse this author
Asai, Tetsuya Browse this author →KAKEN DB
Amemiya, Yoshihito Browse this author →KAKEN DB
Keywords: Complementary metal-oxide-semiconductor (CMOS)
current reference
power-aware large-scale integrations (LSIs)
self-biasing circuit
subthreshold region
temperature dependence
ultralow power
weak inversion
Issue Date: Sep-2010
Publisher: IEEE: Institute of Electrical and Electronics Engineers
Journal Title: IEEE Transactions on Circuits and Systems II : Express Briefs
Volume: 57
Issue: 9
Start Page: 681
End Page: 685
Publisher DOI: 10.1109/TCSII.2010.2056051
Abstract: A low-power CMOS current reference circuit was developed using a 0.35-μm standard CMOS process technology. The circuit consists of MOSFET circuits operating in the subthreshold region and uses no resistors. It compensates for the temperature effect on mobility μ and threshold voltage V_[TH] of MOSFETs and generates a reference current that is insensitive to temperature and supply voltage. Theoretical analyses and experimental results showed that the circuit generates a stable reference current of 100 nA. The temperature coefficient of the current was 520 ppm/℃ at best and 600 ppm/℃ on average in the range of 0 ℃-80 ℃. The line regulation was 0.2%/V in a supply voltage range of 1.8-3 V. The power dissipation was 1μW, and the chip area was 0.015 mm2. Our circuit would be suitable for use in subthreshold-operated power-aware large-scale integrations.
Rights: © 2010 IEEE. Personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution to servers or lists, or to reuse any copyrighted component of this work in other works must be obtained from the IEEE.
Type: article
URI: http://hdl.handle.net/2115/44205
Appears in Collections:情報科学院・情報科学研究院 (Graduate School of Information Science and Technology / Faculty of Information Science and Technology) > 雑誌発表論文等 (Peer-reviewed Journal Articles, etc)

Submitter: 雨宮 好仁

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