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Diffraction microscopy using 20 kV electron beam for multiwall carbon nanotubes
Title: | Diffraction microscopy using 20 kV electron beam for multiwall carbon nanotubes |
Authors: | Kamimura, Osamu Browse this author | Kawahara, Kota Browse this author | Doi, Takahisa Browse this author | Dobashi, Takashi Browse this author | Abe, Takashi Browse this author | Gohara, Kazutoshi Browse this author |
Keywords: | carbon nanotubes | electron diffraction | electron microscopy | image reconstruction |
Issue Date: | Jan-2008 |
Publisher: | American Institute of Physics (AIP) |
Journal Title: | Applied Physics Letters |
Volume: | 92 |
Issue: | 2 |
Start Page: | 024106-1 |
End Page: | 024106-3 |
Publisher DOI: | 10.1063/1.2834372 |
Abstract: | Diffraction microscopy with iterative phase retrieval using a 20 kV electron beam was carried out to explore the possibility of high-resolution imaging for radiation-sensitive materials. Fine, homogeneous, and isolated multiwall carbon nanotubes (MWCNTs) were used as specimens. To avoid lens aberrations, the diffraction patterns were recorded without a postspecimen lens. One- and two-dimensional iterative phase retrievals were executed. Images reconstructed from the diffraction pattern alone showed a characteristic structure of MWCNTs with the finest feature corresponding to a carbon wall spacing of 0.34 nm. |
Rights: | Copyright 2008 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. |
Type: | article |
URI: | http://hdl.handle.net/2115/45432 |
Appears in Collections: | 工学院・工学研究院 (Graduate School of Engineering / Faculty of Engineering) > 雑誌発表論文等 (Peer-reviewed Journal Articles, etc)
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Submitter: 郷原 一寿
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