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Diffraction microscopy using 20 kV electron beam for multiwall carbon nanotubes

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Title: Diffraction microscopy using 20 kV electron beam for multiwall carbon nanotubes
Authors: Kamimura, Osamu Browse this author
Kawahara, Kota Browse this author
Doi, Takahisa Browse this author
Dobashi, Takashi Browse this author
Abe, Takashi Browse this author
Gohara, Kazutoshi Browse this author
Keywords: carbon nanotubes
electron diffraction
electron microscopy
image reconstruction
Issue Date: Jan-2008
Publisher: American Institute of Physics (AIP)
Journal Title: Applied Physics Letters
Volume: 92
Issue: 2
Start Page: 024106-1
End Page: 024106-3
Publisher DOI: 10.1063/1.2834372
Abstract: Diffraction microscopy with iterative phase retrieval using a 20 kV electron beam was carried out to explore the possibility of high-resolution imaging for radiation-sensitive materials. Fine, homogeneous, and isolated multiwall carbon nanotubes (MWCNTs) were used as specimens. To avoid lens aberrations, the diffraction patterns were recorded without a postspecimen lens. One- and two-dimensional iterative phase retrievals were executed. Images reconstructed from the diffraction pattern alone showed a characteristic structure of MWCNTs with the finest feature corresponding to a carbon wall spacing of 0.34 nm.
Rights: Copyright 2008 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics.
Type: article
Appears in Collections:工学院・工学研究院 (Graduate School of Engineering / Faculty of Engineering) > 雑誌発表論文等 (Peer-reviewed Journal Articles, etc)

Submitter: 郷原 一寿

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