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A New Measurement System for the Perpendicular Complex Permittivity to DUT Sheet by Stripline Simulation
| Title: | A New Measurement System for the Perpendicular Complex Permittivity to DUT Sheet by Stripline Simulation |
| Authors: | Suzuki, Hirosuke Browse this author | | Hotchi, Tomio Browse this author | | Nojima, Toshio Browse this author →KAKEN DB |
| Keywords: | Complex permittivity | | multifrequency measurement | | nonpattern fabrication | | simulation | | stripline resonator |
| Issue Date: | Sep-2012 |
| Publisher: | IEEE |
| Journal Title: | IEEE Transactions on Instrumentation and Measurement |
| Volume: | 61 |
| Issue: | 9 |
| Start Page: | 2476 |
| End Page: | 2482 |
| Publisher DOI: | 10.1109/TIM.2012.2192334 |
| Abstract: | The relative dielectric constant εr, is calculated by quasi-static and frequency-dependent hybrid-mode analysis of two layers of dielectric materials (a sample material and a resonator base material) after measuring the rate of change of the resonating frequency of a sheet material under test sandwiched between a sheet metal and a calibrated stripline resonator. This method corrects the fringing effect of the resonator by using two resonators that have slightly different resonating frequencies. In the present study, tanδ is calculated by balancing the conductor loss. The features of this method are as follows: 1) Measurement of εr and tanδ is accurate. 2) Measurement can occur at several frequencies simultaneously. 3) Measurement can be made of εr and tanδ in the E direction perpendicular to the sheet material, e.g., a printed circuit board. 4) A metal pattern is not required. Only the sheet material under test is necessary. 5) Measurement provides accurate data since there is no radiation loss. This method is useful for measurement in the range 0.5-14 GHz, calculated at multiple frequencies. Fully automatic calculation can be achieved by computer analysis through connection to a network analyzer. |
| Rights: | © 2012 IEEE. Reprinted, with permission, from Suzuki, H.; Hotchi, T.; Nojima, T., A New Measurement System for the Perpendicular Complex Permittivity to DUT Sheet by Stripline Simulation, IEEE Transactions on Instrumentation and Measurement, Sept. 2012. This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of Hokkaido University products or services. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to pubs-permissions@ieee.org. By choosing to view this document, you agree to all provisions of the copyright laws protecting it. |
| Type: | article (author version) |
| URI: | http://hdl.handle.net/2115/50279 |
| Appears in Collections: | 情報科学院・情報科学研究院 (Graduate School of Information Science and Technology / Faculty of Information Science and Technology) > 雑誌発表論文等 (Peer-reviewed Journal Articles, etc)
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Submitter: 野島 俊雄
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