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Fabrication and low-temperature transport properties of selectively grown dual-gated single-electron transistors

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Title: Fabrication and low-temperature transport properties of selectively grown dual-gated single-electron transistors
Authors: Motohisa, J.1 Browse this author →KAKEN DB
Nakajima, F. Browse this author
Fukui, T. Browse this author →KAKEN DB
van der Wiel, W. G. Browse this author
Elzerman, J. M. Browse this author
De Franceschi, S. Browse this author
Kouwenhoven, L. P. Browse this author
Authors(alt): 本久, 順一1
Issue Date: 15-Apr-2002
Publisher: American Institute of Physics
Journal Title: Applied Physics Letters
Volume: 80
Issue: 15
Start Page: 2797
End Page: 2799
Publisher DOI: 10.1063/1.1470246
Abstract: We report on the fabrication of a dual-gated single-electron transistor (SET) based on a quantum dot (QD) formed by selective area growth of metalorganic vapor-phase epitaxy, and its low-temperature transport properties. We observe clear Coulomb oscillations in a SET fabricated in combination with direct growth of nanostructures and lithographically defined metal gates. The magnetic field dependence of the Coulomb oscillations as well as the Coulomb diamonds suggest strong carrier confinement in our QD.
Rights: Copyright © 2002 American Institute of Physics
Relation: http://www.aip.org/
Type: article
URI: http://hdl.handle.net/2115/5522
Appears in Collections:量子集積エレクトロニクス研究センター (Research Center for Integrated Quantum Electronics) > 雑誌発表論文等 (Peer-reviewed Journal Articles, etc)

Submitter: 本久 順一

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