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Nanoscale mechanical contacts mapped by ultrashort time-scale electron transport

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Title: Nanoscale mechanical contacts mapped by ultrashort time-scale electron transport
Authors: Tomoda, Motonobu Browse this author →KAKEN DB
Dehoux, Thomas Browse this author
Iwasaki, Yohei Browse this author
Matsuda, Osamu Browse this author →KAKEN DB
Gusev, Vitalyi E. Browse this author
Wright, Oliver B. Browse this author →KAKEN DB
Issue Date: 25-Apr-2014
Publisher: Nature Publishing Group
Journal Title: Scientific Reports
Volume: 4
Start Page: 4790-1
End Page: 4790-5
Publisher DOI: 10.1038/srep04790
PMID: 24763385
Abstract: Mechanical contacts are crucial to systems in engineering, electronics and biology. The microscopic nature of the contacting surfaces determines how they mesh on the nanoscale. There is thus much interest in methods that can map the actual area of two surfaces in contact-the real contact area during the loading or unloading phases. We address this problem using an ultrafast optical technique to generate non-equilibrium electrons that diffuse across a nanoscale mechanical contact between two thin gold films deposited on sapphire. We image this process in the contact and near-contact regions to micron resolution in situ using transient optical reflectivity changes on femtosecond time scales. By use of a model of the ultrashort-time electron dynamics, we account for an up to similar to 40%dropin the transient optical reflectivity change on contact. We thereby show how the real contact area of a nanoscale contact can be mapped. Applications include the probing of microelectronic mechanical devices.
Type: article
Appears in Collections:工学院・工学研究院 (Graduate School of Engineering / Faculty of Engineering) > 雑誌発表論文等 (Peer-reviewed Journal Articles, etc)

Submitter: 友田 基信

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