Nanoscale mechanical contacts mapped by ultrashort time-scale electron transport

Tomoda, Motonobu; Dehoux, Thomas; Iwasaki, Yohei; Matsuda, Osamu; Gusev, Vitalyi E.; Wright, Oliver B.

doi:10.1038/srep04790


Hokkaido University \| Library \| HUSCAP	Advanced Search		言語

	Home
	About HUSCAP
	Open Access Policy

	Browse by Author

Browse
	Communities & Collections

	Scholarly Journals
	Theses
	Doctoral Dissertations Listed by Graduate Schools
	Conference Procs.
	Events

	HUSCAP Senior (in Japanese)

	Societies

	Downloads (country)

For university staff
	How to post your papers to HUSCAP
	Publication of theses
	Helpline about theses publication

Open Archives Compliant

You can search our collection also at:
	Google
	Google Scholar
	CiNii
	IRDB
	OAIster
	NDLTD

Hokkaido University Collection of Scholarly and Academic Papers >
Graduate School of Engineering / Faculty of Engineering >
Peer-reviewed Journal Articles, etc >

Nanoscale mechanical contacts mapped by ultrashort time-scale electron transport

This item is licensed under:Creative Commons Attribution-NonCommercial-NoDerivs 3.0 Unported

Files in This Item:

SciRep4 4790.pdf

940.81 kB

PDF

View/Open

Please use this identifier to cite or link to this item:http://hdl.handle.net/2115/56740

Title:	Nanoscale mechanical contacts mapped by ultrashort time-scale electron transport
Authors:	Tomoda, Motonobu Browse this author →KAKEN DB
	Dehoux, Thomas Browse this author
	Iwasaki, Yohei Browse this author
	Matsuda, Osamu Browse this author →KAKEN DB
	Gusev, Vitalyi E. Browse this author
	Wright, Oliver B. Browse this author →KAKEN DB
Issue Date:	25-Apr-2014
Publisher:	Nature Publishing Group
Journal Title:	Scientific Reports
Volume:	4
Start Page:	4790-1
End Page:	4790-5
Publisher DOI:	10.1038/srep04790
PMID:	24763385
Abstract:	Mechanical contacts are crucial to systems in engineering, electronics and biology. The microscopic nature of the contacting surfaces determines how they mesh on the nanoscale. There is thus much interest in methods that can map the actual area of two surfaces in contact-the real contact area during the loading or unloading phases. We address this problem using an ultrafast optical technique to generate non-equilibrium electrons that diffuse across a nanoscale mechanical contact between two thin gold films deposited on sapphire. We image this process in the contact and near-contact regions to micron resolution in situ using transient optical reflectivity changes on femtosecond time scales. By use of a model of the ultrashort-time electron dynamics, we account for an up to similar to 40%dropin the transient optical reflectivity change on contact. We thereby show how the real contact area of a nanoscale contact can be mapped. Applications include the probing of microelectronic mechanical devices.
Rights:	http://creativecommons.org/licenses/by-nc-nd/3.0/
Type:	article
URI:	http://hdl.handle.net/2115/56740
Appears in Collections:	工学院・工学研究院 (Graduate School of Engineering / Faculty of Engineering) > 雑誌発表論文等 (Peer-reviewed Journal Articles, etc)

Submitter: 友田基信

OAI-PMH ( junii2 , jpcoar_1.0 )

- Hokkaido University