Photothermal probing of inhomogeneously modulated transparent thin films


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Please use this identifier to cite or link to this item:http://hdl.handle.net/2115/5796

Title:	Photothermal probing of inhomogeneously modulated transparent thin films
Authors:	Wright, O. B.¹ Browse this author →KAKEN DB
	Li Voti, R. Browse this author
	Matsuda, O. Browse this author →KAKEN DB
	Larciprete, M. C. Browse this author
	Bertolotti, M. Browse this author
	Sibilia, C. Browse this author
Authors(alt):	ライト, オリバーバーナード¹
Issue Date:	15-Apr-2002
Publisher:	American Institute of Physics
Journal Title:	JOURNAL OF APPLIED PHYSICS
Volume:	91
Issue:	8
Start Page:	5002
End Page:	5009
Publisher DOI:	10.1063/1.1462414
Abstract:	The problem of the photothermal modulation of optical beams passing through multilayer films is an extremely complex one owing to the inhomogeneously modulated refractive index combined with multiple optical reflections inside the sample. This problem has so far not been given an exact analytical treatment in the field of photothermal probing. We consider here such a treatment for normal-incidence optical probing in reflectance of photothermally modulated single-layer thin-film samples with arbitrary optical constants. The validity of the method is demonstrated by application to a thin transparent film of silica on a silicon substrate.
Rights:	Copyright © 2002 American Institute of Physics
Relation:	http://www.aip.org/
Type:	article
URI:	http://hdl.handle.net/2115/5796
Appears in Collections:	工学院・工学研究院 (Graduate School of Engineering / Faculty of Engineering) > 雑誌発表論文等 (Peer-reviewed Journal Articles, etc)

Submitter: WRIGHT O. B.

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