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Estimating Regions of Deterioration in Electron Microscope Images of Rubber Materials via a Transfer Learning-Based Anomaly Detection Model

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Please use this identifier to cite or link to this item:http://hdl.handle.net/2115/76163

Title: Estimating Regions of Deterioration in Electron Microscope Images of Rubber Materials via a Transfer Learning-Based Anomaly Detection Model
Authors: Togo, Ren Browse this author
Saito, Naoki Browse this author
Ogawa, Takahiro Browse this author →KAKEN DB
Haseyama, Miki Browse this author →KAKEN DB
Keywords: Materials informatics
anomaly detection
deep learning
transfer learning
Issue Date: Nov-2019
Publisher: IEEE
Journal Title: IEEE Access
Volume: 7
Start Page: 162395
End Page: 162404
Publisher DOI: 10.1109/ACCESS.2019.2950972
Abstract: A method for estimating regions of deterioration in electron microscope images of rubber materials is presented in this paper. Deterioration of rubber materials is caused by molecular cleavage, external force, and heat. An understanding of these characteristics is essential in the eld of material science for the development of durable rubber materials. Rubber material deterioration can be observed by using on electron microscope but it requires much effort and specialized knowledge to nd regions of deterioration. In this paper, we propose an automated deterioration region estimation method based on deep learning and anomaly detection techniques to support such material development. Our anomaly detection model, called Transfer Learning-based Deep Autoencoding Gaussian Mixture Model (TL-DAGMM), uses only normal regions for training since obtaining training data for regions of deterioration is dif cult. TL-DAGMMmakes use of extracted high representation features from a pre-trained deep learning model and can automatically learn the characteristics of normal rubber material regions. Regions of deterioration are estimated at the pixel level by calculated anomaly scores. Experiments on real rubber material electron microscope images demonstrated the effectiveness of our model.
Rights: https://creativecommons.org/licenses/by/4.0/
Type: article
URI: http://hdl.handle.net/2115/76163
Appears in Collections:情報科学院・情報科学研究院 (Graduate School of Information Science and Technology / Faculty of Information Science and Technology) > 雑誌発表論文等 (Peer-reviewed Journal Articles, etc)

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