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Origin of positive fixed charge at insulator/AlGaN interfaces and its control by AlGaN composition

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Please use this identifier to cite or link to this item:http://hdl.handle.net/2115/70734

Title: Origin of positive fixed charge at insulator/AlGaN interfaces and its control by AlGaN composition
Authors: Matys, M. Browse this author
Stoklas, R. Browse this author
Blaho, M. Browse this author
Adamowicz, B. Browse this author
Issue Date: 15-Jun-2017
Publisher: American Institute of Physics (AIP)
Journal Title: Applied physics letters
Volume: 110
Issue: 24
Start Page: 243505
Publisher DOI: 10.1063/1.4986482
Abstract: The key feature for the precise tuning of V-th in GaN-based metal-insulator-semiconductor (MIS) high electron mobility transistors is the control of the positive fixed charge (Q(f)) at the insulator/III-N interfaces, whose amount is often comparable to the negative surface polarization charge (Q(pol)(-)). In order to clarify the origin of Q(f), we carried out a comprehensive capacitance-voltage (C-V) characterization of SiO2/AlxGa1-xN/GaN and SiN/AlxGa1-xN/GaN structures with Al composition (x) varying from 0.15 to 0.4. For both types of structures, we observed a significant V-th shift in C-V curves towards the positive gate voltage with increasing x. On the contrary, the Schottky gate structures exhibited Vth shift towards the more negative biases. From the numerical simulations of C-V curves using the Poisson's equation supported by the analytical calculations of V-th, we showed that the V-th shift in the examined MIS structures is due to a significant decrease in the positive Q(f) with rising x. Finally, we examined this result with respect to various hypotheses developed in the literature to explain the origin of the positive Q(f) at insulator/III-N interfaces.
Rights: This article may be downloaded for personal use only. Any other use requires prior permission of the author and AIP Publishing.The following article appeared in Applied Physics Letters, 243505 (2017) and may be found at http://aip.scitation.org/doi/10.1063/1.4986482.
Type: article
URI: http://hdl.handle.net/2115/70734
Appears in Collections:量子集積エレクトロニクス研究センター (Research Center for Integrated Quantum Electronics) > 雑誌発表論文等 (Peer-reviewed Journal Articles, etc)

Submitter: Maciej Franciszek Matys

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