|
|
Hokkaido University Collection of Scholarly and Academic Papers >
Showing results 1 to 4 of 4
| Type | Author(s) | Title | Other Titles | Citation | Citation(alt) | Issue Date | | article | Fujii, Takashi; Arita, Masashi; Takahashi, Yasuo; Fujiwara, Ichiro | Analysis of resistance switching and conductive filaments inside Cu-Ge-S using in situ transmission electron microscopy | - | Journal of Materials Research | - | 28-Mar-2012 |
| article | Fujii, Takashi; Arita, Masashi; Hamada, Kouichi; Kondo, Hirofumi; Kaji, Hiromichi; Takahashi, Yasuo; Moniwa, Masahiro; Fujiwara, Ichiro; Yamaguchi, Takeshi; Aoki, Masaki; Maeno, Yoshinori; Kobayashi, Toshio; Yoshimaru, Masaki | I-V measurement of NiO nanoregion during observation by transmission electron microscopy | - | Journal of Applied Physics | - | 1-Mar-2011 |
| article | Fujii, Takashi; Arita, Masashi; Takahashi, Yasuo; Fujiwara, Ichiro | In situ transmission electron microscopy analysis of conductive filament during solid electrolyte resistance switching | - | Applied Physics Letters | - | 23-May-2011 |
| article (author version) | Kondo, Hirofumi; Arita, Masashi; Fujii, Takashi; Kaji, Hiromichi; Moniwa, Masahiro; Yamaguchi, Takeshi; Fujiwara, Ichiro; Yoshimaru, Masaki; Takahashi, Yasuo | The Observation of “Conduction Spot” on NiO Resistance Random Access Memory | - | Japanese Journal of Applied Physics | - | Aug-2011 |
Showing results 1 to 4 of 4
|
